Renhua Zhang, Jing Tian, Hongbo Su, Xiao-Ming Sun, Zhao-Liang Li, Zhilin Zhu. A Measuring Device for Studying Scaling of Emissivities from Sub-pixel to Pixel. In IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2006, July 31 - August 4, 2006, Denver, Colorado, USA, Proceedings. pages 2056-2059, IEEE, 2006. [doi]
Abstract is missing.