Yaojun Zhang, XiaoBin Wang, Yong Li 0009, Alex K. Jones, Yiran Chen. Asymmetry of MTJ switching and its implication to STT-RAM designs. In Wolfgang Rosenstiel, Lothar Thiele, editors, 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012. pages 1313-1318, IEEE, 2012. [doi]
Abstract is missing.