Meng Zhang, Fei Wu, Qin Yu, Weihua Liu, Lanlan Cui, Yahui Zhao, Changsheng Xie. BeLDPC: Bit Errors Aware Adaptive Rate LDPC Codes for 3D TLC NAND Flash Memory. In 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020. pages 302-305, IEEE, 2020. [doi]
@inproceedings{ZhangWYLCZX20,
title = {BeLDPC: Bit Errors Aware Adaptive Rate LDPC Codes for 3D TLC NAND Flash Memory},
author = {Meng Zhang and Fei Wu and Qin Yu and Weihua Liu and Lanlan Cui and Yahui Zhao and Changsheng Xie},
year = {2020},
doi = {10.23919/DATE48585.2020.9116324},
url = {https://doi.org/10.23919/DATE48585.2020.9116324},
researchr = {https://researchr.org/publication/ZhangWYLCZX20},
cites = {0},
citedby = {0},
pages = {302-305},
booktitle = {2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020},
publisher = {IEEE},
isbn = {978-3-9819263-4-7},
}