Efficient high-sigma yield analysis for high dimensional problems

Moning Zhang, Zuochang Ye, Yan Wang. Efficient high-sigma yield analysis for high dimensional problems. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014. pages 1-6, IEEE, 2014. [doi]

@inproceedings{ZhangYW14-0,
  title = {Efficient high-sigma yield analysis for high dimensional problems},
  author = {Moning Zhang and Zuochang Ye and Yan Wang},
  year = {2014},
  doi = {10.7873/DATE2014.120},
  url = {http://dx.doi.org/10.7873/DATE2014.120},
  researchr = {https://researchr.org/publication/ZhangYW14-0},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014},
  publisher = {IEEE},
}