Fast Test Method of Intelligent Image Recognition System Based on Antagonistic Samples

Lilei Zhang, Jinyong Yao, Kai Wang. Fast Test Method of Intelligent Image Recognition System Based on Antagonistic Samples. In 7th International Conference on Dependable Systems and Their Applications, DSA 2020, Xi'an, China, November 28-29, 2020. pages 258-262, IEEE, 2020. [doi]

Abstract

Abstract is missing.