Long Zhang, Lanfei Yan, Zhenyu Zhang, Jian Zhang, W. K. Chan, Zheng Zheng. A theoretical analysis on cloning the failed test cases to improve spectrum-based fault localization. Journal of Systems and Software, 129:35-57, 2017. [doi]
@article{ZhangYZZCZ17,
title = {A theoretical analysis on cloning the failed test cases to improve spectrum-based fault localization},
author = {Long Zhang and Lanfei Yan and Zhenyu Zhang and Jian Zhang and W. K. Chan and Zheng Zheng},
year = {2017},
doi = {10.1016/j.jss.2017.04.017},
url = {https://doi.org/10.1016/j.jss.2017.04.017},
researchr = {https://researchr.org/publication/ZhangYZZCZ17},
cites = {0},
citedby = {0},
journal = {Journal of Systems and Software},
volume = {129},
pages = {35-57},
}