Sai-Yin Zhang, Zhong-Zhan Zhang. Analysis of accelerated degradation test under constant stress with errors for longitudinal data. In 2011 IEEE International Conference on Intelligence and Security Informatics, ISI 2011, Beijing, China, 10-12 July, 2011. pages 320-324, IEEE, 2011. [doi]
@inproceedings{ZhangZ11-50,
title = {Analysis of accelerated degradation test under constant stress with errors for longitudinal data},
author = {Sai-Yin Zhang and Zhong-Zhan Zhang},
year = {2011},
doi = {10.1109/ISI.2011.5984106},
url = {http://dx.doi.org/10.1109/ISI.2011.5984106},
researchr = {https://researchr.org/publication/ZhangZ11-50},
cites = {0},
citedby = {0},
pages = {320-324},
booktitle = {2011 IEEE International Conference on Intelligence and Security Informatics, ISI 2011, Beijing, China, 10-12 July, 2011},
publisher = {IEEE},
}