Analysis of accelerated degradation test under constant stress with errors for longitudinal data

Sai-Yin Zhang, Zhong-Zhan Zhang. Analysis of accelerated degradation test under constant stress with errors for longitudinal data. In 2011 IEEE International Conference on Intelligence and Security Informatics, ISI 2011, Beijing, China, 10-12 July, 2011. pages 320-324, IEEE, 2011. [doi]

Abstract

Abstract is missing.