Long Zhang, Zhenyu Zhang. SeTCHi: Selecting Test Cases to Improve History-Guided Fault Localization. In Sudipto Ghosh, Roberto Natella, Bojan Cukic, Robin Poston, Nuno Laranjeiro, editors, 2018 IEEE International Symposium on Software Reliability Engineering Workshops, ISSRE Workshops, Memphis, TN, USA, October 15-18, 2018. pages 200-207, IEEE, 2018. [doi]
Abstract is missing.