Diagnostic Test Generation for Transition Delay Faults Using Stuck-At Fault Detection Tools

Yu Zhang, Bei Zhang, Vishwani D. Agrawal. Diagnostic Test Generation for Transition Delay Faults Using Stuck-At Fault Detection Tools. J. Electronic Testing, 30(6):763-780, 2014. [doi]

Authors

Yu Zhang

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Bei Zhang

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Vishwani D. Agrawal

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