Zizhao Zhang, Han Zhang, Sercan Ömer Arik, Honglak Lee, Tomas Pfister. Distilling Effective Supervision From Severe Label Noise. In 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2020, Seattle, WA, USA, June 13-19, 2020. pages 9291-9300, IEEE, 2020. [doi]
Abstract is missing.