XianWei Zhang, Youtao Zhang, Bruce R. Childers, Jun Yang. Exploiting DRAM restore time variations in deep sub-micron scaling. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 477-482, ACM, 2015. [doi]
@inproceedings{ZhangZCY15,
title = {Exploiting DRAM restore time variations in deep sub-micron scaling},
author = {XianWei Zhang and Youtao Zhang and Bruce R. Childers and Jun Yang},
year = {2015},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7092436},
researchr = {https://researchr.org/publication/ZhangZCY15},
cites = {0},
citedby = {0},
pages = {477-482},
booktitle = {Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015},
editor = {Wolfgang Nebel and David Atienza},
publisher = {ACM},
isbn = {978-3-9815370-4-8},
}