XianWei Zhang, Youtao Zhang, Bruce R. Childers, Jun Yang. Exploiting DRAM restore time variations in deep sub-micron scaling. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 477-482, ACM, 2015. [doi]
Abstract is missing.