Ping Zhao, Xiaoming Chen, Vera Yuk Ying Chung, Haisheng Li. Low-Complexity Deep No-Reference Light Field Image Quality Assessment with Discriminative EPI Patches Focused. In IEEE International Conference on Consumer Electronics, ICCE 2021, Las Vegas, NV, USA, January 10-12, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.