Yi Zhao, Sujit Dey. Analysis of interconnect crosstalk defect coverage of test sets. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 492-501, IEEE Computer Society, 2000.
@inproceedings{ZhaoD00,
title = {Analysis of interconnect crosstalk defect coverage of test sets},
author = {Yi Zhao and Sujit Dey},
year = {2000},
tags = {test coverage, testing, analysis, coverage},
researchr = {https://researchr.org/publication/ZhaoD00},
cites = {0},
citedby = {0},
pages = {492-501},
booktitle = {Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000},
publisher = {IEEE Computer Society},
}