Weisheng Zhao, T. Devolder, Yahya Lakys, Jacques-Olivier Klein, Claude Chappert, Pascale Mazoyer. Design considerations and strategies for high-reliable STT-MRAM. Microelectronics Reliability, 51(9-11):1454-1458, 2011. [doi]
@article{ZhaoDLKCM11,
title = {Design considerations and strategies for high-reliable STT-MRAM},
author = {Weisheng Zhao and T. Devolder and Yahya Lakys and Jacques-Olivier Klein and Claude Chappert and Pascale Mazoyer},
year = {2011},
doi = {10.1016/j.microrel.2011.07.001},
url = {http://dx.doi.org/10.1016/j.microrel.2011.07.001},
researchr = {https://researchr.org/publication/ZhaoDLKCM11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {9-11},
pages = {1454-1458},
}