Design considerations and strategies for high-reliable STT-MRAM

Weisheng Zhao, T. Devolder, Yahya Lakys, Jacques-Olivier Klein, Claude Chappert, Pascale Mazoyer. Design considerations and strategies for high-reliable STT-MRAM. Microelectronics Reliability, 51(9-11):1454-1458, 2011. [doi]

Abstract

Abstract is missing.