Yunlu Zhao, Tadashi Dohi, Hiroyuki Okamura. Software Test-Run Reliability Modeling with Non-homogeneous Binomial Processes. In 23rd IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2018, Taipei, Taiwan, December 4-7, 2018. pages 145-154, IEEE, 2018. [doi]
Abstract is missing.