Make Big Data Applications More Reliable: Hitless vSDN Migration to Avoid TCAM Depletion

Sicheng Zhao, Yao Jin, Kai Han, Jie Yin, Zuqing Zhu. Make Big Data Applications More Reliable: Hitless vSDN Migration to Avoid TCAM Depletion. In 2018 IEEE International Conference on Communications, ICC 2018, Kansas City, MO, USA, May 20-24, 2018. pages 1-6, IEEE, 2018. [doi]

Abstract

Abstract is missing.