Wear Relief for High-Density Phase Change Memory Through Cell Morphing Considering Process Variation - researchr publication authors

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Mengying Zhao, Lei Jiang, Liang Shi, Youtao Zhang, Chun Jason Xue. Wear Relief for High-Density Phase Change Memory Through Cell Morphing Considering Process Variation. IEEE Trans. on CAD of Integrated Circuits and Systems, 34(2):227-237, 2015. [doi]

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