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Statistical Rare-Event Analysis and Parameter Guidance by Elite Learning Sample Selection

Yue Zhao, Taeyoung Kim, Hosoon Shin, Sheldon X.-D. Tan, Xin Li, Hai-Bao Chen, Hai Wang. Statistical Rare-Event Analysis and Parameter Guidance by Elite Learning Sample Selection. ACM Trans. Design Autom. Electr. Syst., 21(4):56, 2016. [doi]

Authors

Yue Zhao

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Taeyoung Kim

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Hosoon Shin

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Sheldon X.-D. Tan

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Xin Li

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Hai-Bao Chen

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Hai Wang

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