Yue Zhao, Taeyoung Kim, Hosoon Shin, Sheldon X.-D. Tan, Xin Li, Hai-Bao Chen, Hai Wang. Statistical Rare-Event Analysis and Parameter Guidance by Elite Learning Sample Selection. ACM Trans. Design Autom. Electr. Syst., 21(4):56, 2016. [doi]
@article{ZhaoKSTLCW16,
title = {Statistical Rare-Event Analysis and Parameter Guidance by Elite Learning Sample Selection},
author = {Yue Zhao and Taeyoung Kim and Hosoon Shin and Sheldon X.-D. Tan and Xin Li and Hai-Bao Chen and Hai Wang},
year = {2016},
doi = {10.1145/2875422},
url = {http://doi.acm.org/10.1145/2875422},
researchr = {https://researchr.org/publication/ZhaoKSTLCW16},
cites = {0},
citedby = {0},
journal = {ACM Trans. Design Autom. Electr. Syst.},
volume = {21},
number = {4},
pages = {56},
}