A Classification Framework Using Imperfectly Labeled Data for Manufacturing Applications - researchr publication authors

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Shuo Zhao, Xin Li, Ying-Chi Chen. A Classification Framework Using Imperfectly Labeled Data for Manufacturing Applications. In 25th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2020, Vienna, Austria, September 8-11, 2020. pages 921-928, IEEE, 2020. [doi]

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