Shuo Zhao, Xin Li, Ying-Chi Chen. A Classification Framework Using Imperfectly Labeled Data for Manufacturing Applications. In 25th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2020, Vienna, Austria, September 8-11, 2020. pages 921-928, IEEE, 2020. [doi]
@inproceedings{ZhaoLC20-4, title = {A Classification Framework Using Imperfectly Labeled Data for Manufacturing Applications}, author = {Shuo Zhao and Xin Li and Ying-Chi Chen}, year = {2020}, doi = {10.1109/ETFA46521.2020.9211878}, url = {https://doi.org/10.1109/ETFA46521.2020.9211878}, researchr = {https://researchr.org/publication/ZhaoLC20-4}, cites = {0}, citedby = {0}, pages = {921-928}, booktitle = {25th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2020, Vienna, Austria, September 8-11, 2020}, publisher = {IEEE}, isbn = {978-1-7281-8956-7}, }