A Revisit of Age-Based Replacement Models With Exponential Failure Distributions

Xufeng Zhao, Butong Li, Satoshi Mizutani, Toshio Nakagawa. A Revisit of Age-Based Replacement Models With Exponential Failure Distributions. IEEE Transactions on Reliability, 71(4):1477-1487, 2022. [doi]

Abstract

Abstract is missing.