A MFL Mechanism-Based Self-Supervised Method for Defect Detection With Limited Labeled Samples

He Zhao, Jinhai Liu, Jianhua Tang, Xiangkai Shen, Senxiang Lu, Qiannan Wang. A MFL Mechanism-Based Self-Supervised Method for Defect Detection With Limited Labeled Samples. IEEE T. Instrumentation and Measurement, 72:1-10, 2023. [doi]

@article{ZhaoLTSLW23,
  title = {A MFL Mechanism-Based Self-Supervised Method for Defect Detection With Limited Labeled Samples},
  author = {He Zhao and Jinhai Liu and Jianhua Tang and Xiangkai Shen and Senxiang Lu and Qiannan Wang},
  year = {2023},
  doi = {10.1109/TIM.2022.3212041},
  url = {https://doi.org/10.1109/TIM.2022.3212041},
  researchr = {https://researchr.org/publication/ZhaoLTSLW23},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {72},
  pages = {1-10},
}