A MFL Mechanism-Based Self-Supervised Method for Defect Detection With Limited Labeled Samples

He Zhao, Jinhai Liu, Jianhua Tang, Xiangkai Shen, Senxiang Lu, Qiannan Wang. A MFL Mechanism-Based Self-Supervised Method for Defect Detection With Limited Labeled Samples. IEEE T. Instrumentation and Measurement, 72:1-10, 2023. [doi]

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