Health Assessment Method for Electronic Components Subject to Condition Monitoring and Hard Failure

Shuai Zhao 0003, Viliam Makis, Shaowei Chen, Yong Li. Health Assessment Method for Electronic Components Subject to Condition Monitoring and Hard Failure. IEEE T. Instrumentation and Measurement, 68(1):138-150, 2019. [doi]

Authors

Shuai Zhao 0003

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Viliam Makis

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Shaowei Chen

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Yong Li

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