Shuai Zhao 0003, Viliam Makis, Shaowei Chen, Yong Li. Health Assessment Method for Electronic Components Subject to Condition Monitoring and Hard Failure. IEEE T. Instrumentation and Measurement, 68(1):138-150, 2019. [doi]
@article{ZhaoMCL19,
title = {Health Assessment Method for Electronic Components Subject to Condition Monitoring and Hard Failure},
author = {Shuai Zhao 0003 and Viliam Makis and Shaowei Chen and Yong Li},
year = {2019},
doi = {10.1109/TIM.2018.2839938},
url = {https://doi.org/10.1109/TIM.2018.2839938},
researchr = {https://researchr.org/publication/ZhaoMCL19},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {68},
number = {1},
pages = {138-150},
}