Maximum Likelihood Estimation of Double Alternative Step-Stress Accelerated Life Test for Electronics

Zhicao Zhao, Baowei Song, Xinping Wang, Guozhen Zhang. Maximum Likelihood Estimation of Double Alternative Step-Stress Accelerated Life Test for Electronics. In Hepu Deng, Duoqian Miao, Jingsheng Lei, Fu Lee Wang, editors, Artificial Intelligence and Computational Intelligence - Third International Conference, AICI 2011, Taiyuan, China, September 24-25, 2011, Proceedings, Part I. Volume 7002 of Lecture Notes in Computer Science, pages 27-34, Springer, 2011. [doi]

Abstract

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