Dan Zhao, Shambhu J. Upadhyaya. Power Constrained Test Scheduling with Dynamically Varied TAM. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 273-278, IEEE Computer Society, 2003. [doi]
@inproceedings{ZhaoU03, title = {Power Constrained Test Scheduling with Dynamically Varied TAM}, author = {Dan Zhao and Shambhu J. Upadhyaya}, year = {2003}, url = {http://csdl.computer.org/comp/proceedings/vts/2003/1924/00/19240273abs.htm}, tags = {testing}, researchr = {https://researchr.org/publication/ZhaoU03}, cites = {0}, citedby = {0}, pages = {273-278}, booktitle = {21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA}, publisher = {IEEE Computer Society}, isbn = {0-7695-1924-5}, }