Xiaodong Zhao, Yuehang Xu, Zhang Wen, Yonghao Jia, Tiedi Zhang, Bo Yan, Ruimin Xu. A new Inter-electrode coupling capacitance extraction method for deep-submicron AlGaN/GaN HEMTs. IEICE Electronic Express, 14(15):20170559, 2017. [doi]
@article{ZhaoXWJZYX17,
title = {A new Inter-electrode coupling capacitance extraction method for deep-submicron AlGaN/GaN HEMTs},
author = {Xiaodong Zhao and Yuehang Xu and Zhang Wen and Yonghao Jia and Tiedi Zhang and Bo Yan and Ruimin Xu},
year = {2017},
doi = {10.1587/elex.14.20170559},
url = {https://doi.org/10.1587/elex.14.20170559},
researchr = {https://researchr.org/publication/ZhaoXWJZYX17},
cites = {0},
citedby = {0},
journal = {IEICE Electronic Express},
volume = {14},
number = {15},
pages = {20170559},
}