Yiju Zhao, Youngki Yoon, Lan Wei. A Multi-Level Simulation of GeH FETs: From Nanomaterial and Device Characteristics to Circuit Performance Optimization. In Christof Teuscher, Jie Han 0001, editors, Proceedings of the 17th ACM International Symposium on Nanoscale Architectures, NANOARCH 2022, Virtual, OR, USA, December 7-9, 2022. ACM, 2022. [doi]
Abstract is missing.