A Method for the Correction of N-Ports Scattering Parameters Measurement

Baishan Zhao, Yi-Sheng Zhu. A Method for the Correction of N-Ports Scattering Parameters Measurement. In IEEE Asia Pacific Conference on Circuits and Systems 2006, APCCAS 2006, Singapore, 4-7 December 2006. pages 1639-1642, IEEE, 2006. [doi]

@inproceedings{ZhaoZ06:0,
  title = {A Method for the Correction of N-Ports Scattering Parameters Measurement},
  author = {Baishan Zhao and Yi-Sheng Zhu},
  year = {2006},
  doi = {10.1109/APCCAS.2006.342079},
  url = {http://dx.doi.org/10.1109/APCCAS.2006.342079},
  researchr = {https://researchr.org/publication/ZhaoZ06%3A0},
  cites = {0},
  citedby = {0},
  pages = {1639-1642},
  booktitle = {IEEE Asia Pacific Conference on Circuits and Systems 2006, APCCAS 2006, Singapore, 4-7 December 2006},
  publisher = {IEEE},
}