A Method for the Correction of N-Ports Scattering Parameters Measurement

Baishan Zhao, Yi-Sheng Zhu. A Method for the Correction of N-Ports Scattering Parameters Measurement. In IEEE Asia Pacific Conference on Circuits and Systems 2006, APCCAS 2006, Singapore, 4-7 December 2006. pages 1639-1642, IEEE, 2006. [doi]

Abstract

Abstract is missing.