ISTA: Automatic Test Case Generation and Optimization for Intelligent Systems based on Coverage Analysis - researchr publication authors

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Wei Zheng 0006, Lidan Lin, Xiang Chen, Guoliang Liu, Hao Huang, Jinjin Shen, Qingqing Xu, Yizeng Gu. ISTA: Automatic Test Case Generation and Optimization for Intelligent Systems based on Coverage Analysis. In Tao Zhang, Xin Xia, Nicole Novielli, editors, IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2023, Taipa, Macao, March 21-24, 2023. pages 758-762, IEEE, 2023. [doi]

This author has not been identified. Look up 'Wei Zheng 0006' in GoogleThis author has not been identified. Look up 'Lidan Lin' in GoogleThis author has not been identified. It may be one of the following persons:

Xiang 'Anthony' Chen

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