Wei Zheng 0006, Lidan Lin, Xiang Chen, Guoliang Liu, Hao Huang, Jinjin Shen, Qingqing Xu, Yizeng Gu. ISTA: Automatic Test Case Generation and Optimization for Intelligent Systems based on Coverage Analysis. In Tao Zhang, Xin Xia, Nicole Novielli, editors, IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2023, Taipa, Macao, March 21-24, 2023. pages 758-762, IEEE, 2023. [doi]
Abstract is missing.