A Bayesian Approach for Characterizing and Mitigating Gate and Measurement Errors

Muqing Zheng, Ang Li, Tamás Terlaky, Xiu Yang. A Bayesian Approach for Characterizing and Mitigating Gate and Measurement Errors. ACM Trans. Quantum Comput., 4(2), June 2023. [doi]

Abstract

Abstract is missing.