Dark current analysis of P-type and N-type pixels under total ionizing dose radiation effects - researchr publication authors

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Ran Zheng, Jia Wang. Dark current analysis of P-type and N-type pixels under total ionizing dose radiation effects. In 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016, Jeju, South Korea, October 25-28, 2016. pages 499-501, IEEE, 2016. [doi]

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