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Takagi-Sugeno Model Based Analysis of EWMA RtR Control of Batch Processes With Stochastic Metrology Delay and Mixed Products

Ying Zheng, David Shan-Hill Wong, Yanwei Wang, Huajing Fang. Takagi-Sugeno Model Based Analysis of EWMA RtR Control of Batch Processes With Stochastic Metrology Delay and Mixed Products. IEEE T. Cybernetics, 44(7):1155-1168, 2014. [doi]

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