Yu Zheng, Shuo Yang, Swarup Bhunia. SeMIA: Self-Similarity-Based IC Integrity Analysis. IEEE Trans. on CAD of Integrated Circuits and Systems, 35(1):37-48, 2016. [doi]
@article{ZhengYB16,
title = {SeMIA: Self-Similarity-Based IC Integrity Analysis},
author = {Yu Zheng and Shuo Yang and Swarup Bhunia},
year = {2016},
doi = {10.1109/TCAD.2015.2449231},
url = {http://dx.doi.org/10.1109/TCAD.2015.2449231},
researchr = {https://researchr.org/publication/ZhengYB16},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {35},
number = {1},
pages = {37-48},
}