Few-shot intelligent fault diagnosis based on an improved meta-relation network

Xiaoqing Zheng, Changyuan Yue, Jiang Wei, Anke Xue, Ming Ge, Yaguang Kong. Few-shot intelligent fault diagnosis based on an improved meta-relation network. Appl. Intell., 53(24):30080-30096, December 2023. [doi]

Abstract

Abstract is missing.