Zexin Zhong, Jiangchao Liu, Diyu Wu, Peng Di, Yulei Sui, Alex X. Liu. Field-Based Static Taint Analysis for Industrial Microservices. In 44th IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, ICSE (SEIP) 2022, Pittsburgh, PA, USA, May 22-24, 2022. pages 149-150, IEEE, 2022. [doi]
@inproceedings{ZhongLWDSL22,
title = {Field-Based Static Taint Analysis for Industrial Microservices},
author = {Zexin Zhong and Jiangchao Liu and Diyu Wu and Peng Di and Yulei Sui and Alex X. Liu},
year = {2022},
doi = {10.1109/ICSE-SEIP55303.2022.9794096},
url = {https://doi.org/10.1109/ICSE-SEIP55303.2022.9794096},
researchr = {https://researchr.org/publication/ZhongLWDSL22},
cites = {0},
citedby = {0},
pages = {149-150},
booktitle = {44th IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, ICSE (SEIP) 2022, Pittsburgh, PA, USA, May 22-24, 2022},
publisher = {IEEE},
isbn = {978-1-6654-9590-5},
}