Pan Zhongliang, Chen Ling, Liu Shouqiang, Guangzhao Zhang. Neural Network Approach for Multiple Fault Test of Digital Circuit. In Proceedings of the Sixth International Conference on Intelligent Systems Design and Applications (ISDA 2006), October 16-18, 2006, Jinan, China. pages 24-29, IEEE Computer Society, 2006. [doi]
Abstract is missing.