Reliable and Intelligent Fault Diagnosis With Evidential VGG Neural Networks

Han-Ting Zhou, Wenhe Chen, Longsheng Cheng, Darren Williams, Clarence W. de Silva, Min Xia 0001. Reliable and Intelligent Fault Diagnosis With Evidential VGG Neural Networks. IEEE T. Instrumentation and Measurement, 72:1-12, 2023. [doi]

Authors

Han-Ting Zhou

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Wenhe Chen

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Longsheng Cheng

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Darren Williams

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Clarence W. de Silva

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Min Xia 0001

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