Han-Ting Zhou, Wenhe Chen, Longsheng Cheng, Darren Williams, Clarence W. de Silva, Min Xia 0001. Reliable and Intelligent Fault Diagnosis With Evidential VGG Neural Networks. IEEE T. Instrumentation and Measurement, 72:1-12, 2023. [doi]
@article{ZhouCCWSX23,
title = {Reliable and Intelligent Fault Diagnosis With Evidential VGG Neural Networks},
author = {Han-Ting Zhou and Wenhe Chen and Longsheng Cheng and Darren Williams and Clarence W. de Silva and Min Xia 0001},
year = {2023},
doi = {10.1109/TIM.2023.3250308},
url = {https://doi.org/10.1109/TIM.2023.3250308},
researchr = {https://researchr.org/publication/ZhouCCWSX23},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {72},
pages = {1-12},
}