Guochang Zhou, Baolong Guo, Xiang Gao, Dan Zhao, Yunyi Yan. Research on the System Reliability Modeling Based on Markov Process and Reliability Block Diagram. In Jeng-Shyang Pan, Václav Snásel, Emilio Corchado, Ajith Abraham, Shyue-Liang Wang, editors, Intelligent Data analysis and its Applications, Volume II - Proceeding of the First Euro-China Conference on Intelligent Data Analysis and Applications, June 13-15, 2014, Shenzhen, China. Volume 298 of Advances in Intelligent Systems and Computing, pages 545-553, Springer, 2014. [doi]
Abstract is missing.