Exploring Faster RCNN for Fabric Defect Detection

Hao Zhou, Byunghyun Jang, Yixin Chen, David Troendle. Exploring Faster RCNN for Fabric Defect Detection. In Third International Conference on Artificial Intelligence for Industries, AI4I 2020, Irvine, CA, USA, September 21-23, 2020. pages 52-55, IEEE, 2020. [doi]

Abstract

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