Jun Zhou, Senthil Jayapal, Jan Stuyt, Jos Huisken, Harmke de Groot. The impact of inverse narrow width effect on sub-threshold device sizing. In Proceedings of the 16th Asia South Pacific Design Automation Conference, ASP-DAC 2011, Yokohama, Japan, January 25-27, 2011. pages 267-272, IEEE, 2011. [doi]
@inproceedings{ZhouJSHG11,
title = {The impact of inverse narrow width effect on sub-threshold device sizing},
author = {Jun Zhou and Senthil Jayapal and Jan Stuyt and Jos Huisken and Harmke de Groot},
year = {2011},
doi = {10.1109/ASPDAC.2011.5722196},
url = {http://dx.doi.org/10.1109/ASPDAC.2011.5722196},
researchr = {https://researchr.org/publication/ZhouJSHG11},
cites = {0},
citedby = {0},
pages = {267-272},
booktitle = {Proceedings of the 16th Asia South Pacific Design Automation Conference, ASP-DAC 2011, Yokohama, Japan, January 25-27, 2011},
publisher = {IEEE},
isbn = {978-1-4244-7516-2},
}