Jun Zhou, Senthil Jayapal, Jan Stuyt, Jos Huisken, Harmke de Groot. The impact of inverse narrow width effect on sub-threshold device sizing. In Proceedings of the 16th Asia South Pacific Design Automation Conference, ASP-DAC 2011, Yokohama, Japan, January 25-27, 2011. pages 267-272, IEEE, 2011. [doi]
Abstract is missing.